Products
Window to the Nano World
Ion Beam Polisher
Ion Beam PolisherIP-8K/IP-10K
IP Series(IP-8K/IP-10K)
The IP Series (IP-8K / IP-10K) is designed for precise cross-section preparation using an argon ion beam.
It delivers high-quality cross sections ideal for detailed microstructural analysis.
By utilizing argon ion beam milling, the IP Series minimizes deformation, cracks, and contamination typically caused by mechanical polishing — producing clean, damage-free surfaces that enhance the reliability of SEM and EDS analysis.
With optional Cooling and Air Protection Module, even heat- and oxidation-sensitive samples can be processed with confidence. The system is suitable for a wide range of materials, including metals, ceramics, and battery components.
“Precision Polishing for Perfect Analysis”
Principles of Ion-beam Polishing
Overview
Achieve clean, damage-free cross sections with ion-beam sputtering under vacuum.
Unlike mechanical polishing, the IP Series minimizes structural damage and contamination — enabling more accurate observation of a sample’s internal structure.
Key Benefits
- Reveal true internal structures with confidence
- Achieve consistently clean, artifact-free results
- Minimize contamination and polishing artifacts for more reliable insights
- Precise internal structure analysis across a wide range of materials
- Deliver reproducible results you can trust
Cross-section Milling
Overview
Reveal internal structures with precision using ion-beam cross-section milling — enabling detailed analysis of complex materials such as metals, ceramics, and battery electrodes.
Key Benefits
- Achieve smooth, high-quality cross sections
- Minimize damage and artifacts for more reliable results
- Ideal for failure analysis and internal structure evaluation
- Versatile across metals, ceramics, and battery materials
Flat Milling
Overview
Prepare large, uniformly polished surfaces with flat ion-beam milling — enabling effective large-area sample preparation and high-quality surface finishing for SEM and EBSD analysis.
Key Benefits
- Achieve uniform, high-quality surface finishing across large areas
- Enable efficient preparation of large-area samples
- Enhance surface quality for clearer SEM imaging
- Optimize processing with flexible and precise control
- Prepare ideal surfaces for reliable EBSD analysis
Peltier Cooling Module
Overview
Maintain stable low-temperature conditions during ion milling to protect heat-sensitive samples — enabling precise cross-section preparation while preserving fine microstructures.
Key Benefits
- Prevent heat-induced damage during ion milling
- Maintain stable low-temperature conditions down to –25 °C
- Preserve delicate microstructures and heat-sensitive materials
- Enable high-precision cross-section preparation and analysis
Air-protection Module
Overview
Protect air-sensitive samples from exposure during transfer and analysis — enabling reliable SEM observation and cross-section analysis without oxidation or contamination.
Key Benefits
- Prevent oxidation and contamination of air-sensitive samples
- Enable seamless transfer from glove box to SEM or ion milling systems
- Ideal for batteries, reactive metals, and sensitive materials
- Preserve native sample integrity throughout preparation and analysis
