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EM-30Plus

EM-30Plus

Benchtop SEM

Description

A high-resolution Tabletop Scanning Electron Microscope (SEM) with specifications and capabilities not matched by any other SEM in its price range. After evaluating the EM-30 Plus your search will be over to find the best compact SEM available.  The companion models of the EM-30AXPlus include integrated EDS elemental micro-analysis.

Applications

   

Specifications

 

 EM-30Plus

 EM-30AXPlus

 Magnification

 20-150,000X 

 Spatial Resoultion

 <5nm

 Accleration Voltage

 1 - 30kV (adjustable in 1kV scale)

 Electron Source

 Pre-Centered Tungsten Filament

 Detector

 SED(DP), BSED(DP)

 SED(DP), BSED(DP), EDS

 Sample Size

 70mm (W) x 45mm (H)

 X-Y/T Traverse

 35x35mm / 0 - 45º

 Automation

 Focus, Filament, Brightness/Contrast

 Data Output Format

 jpg, tiff, BMP

 Dimensions

 400 x 600 x 550 mm

 Weight

 85 kgs

 95 kgs

 Options

Low Vacuum

CoolStage

Panorama 2.0

 30mm Active Size Compact Type EDS (Particle Analysis)

 30mm Active Size Compact Type EDS (MPO included)

 

Optional Products

  • 게시물이 없습니다.

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