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PRODUCT

EM-30

Benchtop SEM

Description

a high-resolution Tabletop Scanning Electron Microscope (SEM) with specifications and capabilities not matched by any other SEM in its price range. After evaluating the EM-30 Series your search will be over to find the best compact SEM available.

Applications

     

Specifications

 

 EM-30

 EM-30AX

 Magnification

 20-100,000X 

 Spatial Resoultion

 <15nm

 Accleration Voltage

 1 - 30kV (adjustable in 1kV scale)

 Electron Source

 Pre-Centered Tungsten Filament

 Detector

 SED(DP)

 SED(DP), EDS

 Sample Size

 70mm (W) x 45mm (H)

 X-Y/T Traverse

 35x35mm / 0 - 45º

 Features

 Measurement Tool

 Remote Control

 Automation

 Focus, Filament, Brightness/Contrast

 Data Output Format

 jpg, tiff, BMP

 Dimensions

 400 x 600 x 550 mm

 Weight

 85 kgs

 95 kgs

 Options

BSED

CoolStage

30mm Active Size Compact Type EDS (Particle Analysis)

30mm Active Size Compact Type EDS (MPO included)

 

Optional Products

  • 게시물이 없습니다.

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