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Cross Section Polisher

CP-8000

Description

CP-8000 is a cross section polisher(CP) using an argon ion beam to polish surfaces of a specimen. As accelerated Ar ion beam reaches the sample in the vacuum condition, atoms of sample surface separate from it.

CP-8000 is suitable to prepare clean cross section for measurement instruments such as SEM, EDS, EBSD, WDS and etc.

Applications


 

Specifications

Gas UsedAr(Argon) gas
Milling Speed500 μm/h (Si at 6kV)
Accelerating Voltage1~8 kV
Beam DiameterApprox. 500 μm
Working Pressure 3.3 x 10-5 torr
Beam AlignmentPrecision beam alignment
using fluorescent screen
Maximum Sample Size20(W) x 10(D) x 9(H)mm
Sample Moving Range(Z: ±2mm, Y: ±2mm)
Stage Swing Rotation -35° ~ +35°
Stage for Flat MillingTilt Range : 40° to 80°
Rotation Speed : 6 rpm/min
Sample Size : Ø30 x 11.4mm
Display Touch panel (1024 x 600 7 inch display)
Chamber Camera Magnification : x5, x10, x20, x40
4 step brightness control
Ion beam observation mode
Digital Camera for sample alignmentMagnification : x5, x10, x20, x40
USB type
Evacuation SystemTurbo-molecular pump (66L/s)
+ Diaphragm pump
Dimension610(W) x 472(D) x 415(H)mm

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