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Cross Section Polisher
Description
CP-8000 is a cross section polisher(CP) using an argon ion beam to polish surfaces of a specimen. As accelerated Ar ion beam reaches the sample in the vacuum condition, atoms of sample surface separate from it.
CP-8000 is suitable to prepare clean cross section for measurement instruments such as SEM, EDS, EBSD, WDS and etc.
Applications
Specifications
| Gas Used | Ar(Argon) gas |
|---|---|
| Milling Speed | 500 μm/h (Si at 6kV) |
| Accelerating Voltage | 1~8 kV |
| Beam Diameter | Approx. 500 μm |
| Working Pressure | 3.3 x 10-5 torr |
| Beam Alignment | Precision beam alignment using fluorescent screen |
| Maximum Sample Size | 20(W) x 10(D) x 9(H)mm |
| Sample Moving Range | (Z: ±2mm, Y: ±2mm) |
| Stage Swing Rotation | -35° ~ +35° |
| Stage for Flat Milling | Tilt Range : 40° to 80° Rotation Speed : 6 rpm/min Sample Size : Ø30 x 11.4mm |
| Display | Touch panel (1024 x 600 7 inch display) |
| Chamber Camera | Magnification : x5, x10, x20, x40 4 step brightness control Ion beam observation mode |
| Digital Camera for sample alignment | Magnification : x5, x10, x20, x40 USB type |
| Evacuation System | Turbo-molecular pump (66L/s) + Diaphragm pump |
| Dimension | 610(W) x 472(D) x 415(H)mm |
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