- Scanning Probe Microscope
- Confocal Laser Scanning Microscope
- X-Ray Fluorescence Spectroscope
- XRF(X-ray Fluorescence Spectroscope) is the emission of characteristic "Secondary" (or fluorescent) X-rays from a material that has been excited by bombarding with high-energy X-rays or gamma ray. The phenomenon is widely used for elemental analysis and chemical and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials.