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COXEM participated in Microscopy conference held by Korean Society of …

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Date Created2020.11.26

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COXEM CO., LTD participated in Microscopy conference held by Korean Society of Microscopy in Pyeongchang from November 12th to 13th, 2020, hosted a luncheon seminar and two poster sessions.

COXEM introduced new products: CP-8000 (Cross-Section Polisher) and SELPA (Secondary Electron Microscope Particle Analysis System) to attendees and had a discussion how to use them for their researches.
COXEM had done joint researches with a government-funded research institute and enterprise institute. The researches include pre-treatment of specimen using CP-8000 and large area particles analysis using SELPA. COXEM gave poster presentations about the researches and new analysis methods using the equipment. And James Yoon, the senior researcher of COXEM application LAB awarded the Best Poster Presentation.

*Poster Sessions*

SELPA : Analysis of large-area coating uniformity of paper using scanning electron microscope
CP-8000 : Study on pore structure in shale reservoir using ion beam cross-section etching system

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